NIHARIKA VARSHNEY; ASHUTOSH DIXIT; SANDEEP SUNORI. A Electrical Behavior Of Total Ionizing Dose Impacts On Hfo2And Al2o3 Gate Oxide Soi Finfet. Elementary Education Online, [S. l.], v. 20, n. 1, p. 7635–7643, 2021. Disponível em: https://ilkogretim-online.org/index.php/pub/article/view/618. Acesso em: 4 jul. 2024.