Characterization Techniques Of Zno Thin Films

Authors

  • Karuna Purushottam Bhole
  • Dr Sanjay Rathore

Keywords:

ZnO, Thin, Flims, Characterization

Abstract

ZnO has a hexagonal wurtzite structure in which each cation is surrounded by four anions and vice versa. Non-centrosymmetric ZnO structures are one of the most essential qualities that make ZnO suitable for piezoelectric and pyroelectric applications because of its tetrahedral coordination structure. Optoelectronic devices, sensors, transducers, catalysis, and medicinal devices all benefit from the unique properties of ZnO thin films and nanostructures. In this article, characterization techniques of ZnO thin films were highlighted.

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Published

2023-12-19

How to Cite

Karuna Purushottam Bhole, & Dr Sanjay Rathore. (2023). Characterization Techniques Of Zno Thin Films. Elementary Education Online, 20(6), 3015–3029. Retrieved from https://ilkogretim-online.org/index.php/pub/article/view/4840

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Section

Articles